Exploratory data analysis and film form: The editing structure of slasher films
نویسنده
چکیده
We analyse the dynamic editing structure of four slasher films released between 1978 and 1983 with simple ordinal time series methods. We show the order structure matrix is a useful exploratory data analytical method for revealing the editing structure of motion pictures without requiring a priori assumptions about the objectives of a film. Comparing the order structure matrices of the four films, we find slasher films share a common editing pattern closely comprising multiple editing regimes with change points between editing patterns occur with large changes in mood and localised clusters of shorter and longer takes are associated with specific narrative events. The multiple editing regimes create different types of frightening experiences for the viewer with slower edited passages creating a pervading sense of foreboding and rapid editing linked to the frenzied violence of body horror, while the interaction of these two modes of expression intensifies the emotional experience of watching a slasher film.
منابع مشابه
A study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کاملRheological, thermal and tensile properties of PE/nanoclay nanocomposites and PE/nanoclay nanocomposite cast films
The effects of three different mixers, two different feeding orders and nanoclay content on the structure development and rheological properties of PE/nanoclay nanocomposite samples were investigated. Fractional Zener and Carreau–Yasuda models were applied to discuss the melt linear viscoelastic properties of the samples. Moreover, scaling law for fractal networks was used to quantify clay disp...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کاملSemiconducting properties of passive films formed on AISI 420 stainless steel in nitric acid solutions
This study focuses on the semiconductor properties of passive films formed on AISI 420 stainless steel immersed in four nitric acid solutions under open circuit potential (OCP) conditions. For this purpose, the passivation parameters and semiconductor properties of passive films were derived from potentiodynamic polarization and Mott–Schottky analysis, respectively. The OCP plots showed that th...
متن کاملCOMPARISON OF PROPERTIES OF TiN/TiCN AND PLASMA NITRIDING/TiCN FILMS DEPOSITED ON THE TOOL STEEL BY PULSED DC- PACVD
In this work, TiN/TiCN & PN/TiCN multilayer films were deposited by plasma- assisted chemical vapour deposition (PACVD). Plasma nitriding (PN) and TiN intermediate layer prior to coating leads to appropriate hardness gradient and it can greatly improve the mechanical properties of the coating. The composition, crystalline structure and phase of the films were investigated by X-ray d...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2012